National Instruments has introduced two new 32-channel PXI Express-based digital instruments and a new eight-slot high-bandwidth PXI Express 3U chassis for advanced automated test applications.

According to National Instruments, the NI PXIe-6544/45 selectable-voltage digital waveform generator and analysers optimize test applications by supporting clock rates of up to 100 and 200 MHz, respectively.

National Instruments says that with typical streaming rates of 660 MB/s, the NI PXIe-6545 is one of the industry’s fastest-streaming digital test products.

Both the NI PXIe-6544/45 digital instruments are designed to make it easier for test engineers to conduct sophisticated analysis of high-speed semiconductor devices and high-definition (HD) multimedia components that require rapid transfers of large amounts of data to and from host memory.

The NI PXIe-1082 chassis is the industry’s first 3U eight-slot PXI Express chassis with seven PXI Express peripheral slots, and is designed to complement the generator and analysers with up to 1 GB/s per-slot bandwidth and up to 4 GB/s of total system bandwidth, the company said.

According to National Instruments, engineers are now able to accurately and automatically test faster semiconductor devices, such as analogue-to-digital converters (ADCs), digital-to-analog converters (DACs), memory devices, ASICs and microcontrollers.

National Instruments

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www.ni.com