Four models are available in the range; the Compact, NanoTec, MicroTec and MicroTec XT.
The Compact is the standard model, with a measuring range from 0.3 to 300 µm.
Four particle sizer models available
The Compact is said to be suitable for bench top particle size analysis in a laboratory, or in production.
The NanoTec, taking into consideration backward scattering, is capable of 0.01 µm measurements, with a total measurement range from 0.01 to 1000 µm.
The measurement range can be switched to 15 µm to 2000 µm through beam expansion.
The MicroTec model has a smaller measuring range, with a lower measurement limit of 0.1 µm.
The MicroTec XT has an upper measuring range of 2000 µm.
Key contact:
Joe Dahdah
John Morris Scientific
info@johnmorris.com.au
www.johnmorris.com.au